Low temperature PECVD (저온플라즈마 화학기상증착장비)

- Manufacturer Samco Inc.
- Manufacture date 2018
- Model PD-100ST
- Location IBS head quarter, C169 clean room 1000 (deposition room)
- Manager None
PURPOSE
This equipment is used to measurement for low temperature detectors. It utilize a liquid TEOS source o deposit SiO2 films at hogh speed using a low temperature process. Furthermore, the proprietary self-bias deposition of thin and thick films with low internal stress.
SPECIFICATION AND PERFORMANCE
- Main Chamber
- STS304
- cylindrical Φ = 260.6 mm
- Maximum 4 inch wafer
- view port for visual confirmation of plasma
- chamber lid opens and closes manually
- Electrodes
- parallel plate (capacitive coupling)
- fixed gap between electrodes: 29 mm
- Resistive heater : Max. 300 ℃
- PID controlled resistive heater : Max. 350 ℃
- PID controlled RF Generator
- 13.56 MHz
- Max. 300 W
- crystal oscillation
- all solid state
- Matching Unit
- automatic matching
- Liquid Source Line
- the flow rate of the vaporized liquid source is directly controlled
- source tank
- source tank heating (75-85 ℃)
- gas flow control
- gas inlet valve :: bellows seal valve (air operated)
- protection to over heat problems
- Process Gas Lines
- Vacuum Gauge
- Process Vacuum Line
- Dry pump (2000 liter/min at 50/60 Hz)
- Pressure Control
- automatic pressure control (variable evacuation conductance)
- System Control
- automatic operation via programmable logic controller