Inductively Coupled Plasma Mass Spectrometer (ICP-MS) 유도 결합 플라즈마 질량분석기
- Manufacturer Agilent Technologies
- Manufacture date 2015
- Model Agilent 7900 ICP-MS
- Location C177, ICP-MS
- Manager None
PURPOSE
ICP-MS is used to analyze trace impurities of various materials for low background research. The impurity levels before and after purification or crystal growth are evaluated mainly for the materials of single crystal growth. The main measurement elements are K, Sr, Ba, Pb, Th, U.
SPECIFICATION AND PERFORMANCE
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